Development of the capability coefficient (Cdl*) for quality control of measuring instruments and systems / Desenvolvimento do coeficiente de capacidade (Cdl*) para o controlo de qualidade dos instrumentos e sistemas de medição

José Eduardo Ferreira Oliveira, Carlos Augusto do Nascimento Oliveira, Rogério Pontes Araújo, Eduardo José Alécio Oliveira, Nelson Gonçalves Silva, Antônio Marcos Figueiredo Soares

Abstract


One of the most relevant problems faced with regard to quality assurance is the ability to carry out measurements with metrological reliability. Knowing the behavior of a measuring instrument or system and properly adapting the measurement process are fundamental features of metrological control. Within this context, the objective of this work is to present the Cdl* capability coefficient, developed with two basic purposes: to verify whether a certain measurement process is capable of measuring a determined measurand, that is, if it is able to perform a measurement with reliability; and to monitor the behavior of a given instrument or measurement system, so that both systematic and random variations can be perceived. The basis used for the development of the Cdl*capability coefficient is presented, as well as a comparison with the Cg capability coefficient, used to verify the capability of measuring instruments and systems. Two experiments with different measurands are presented, highlighting the applicability of the practical use of the coefficient in each situation. as well as, all The statistical treatment performed on the samples used is also presented, involving the verification of normality, outliers, and minimum sample size, in addition to the verification of process control statistics, correlation, and hypothesis tests using the Cdl* and Cg coefficients, amking it possible to conclude that the new capability coefficient presented in this study is capable of contributing to quality control of measurement processes, and of playing an innovative role in the area of metrology.


Keywords


Metrological Control, Capability, Cdl*, Cg, Measurement System.

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DOI: https://doi.org/10.34117/bjdv7n2-117

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